공정능력과 시그마 수준의 표시에 대한 연구

• 영문명: A Study on Expression of Process Capability & Sigma Level
• 발행기관: 한국산업경영시스템학회
• 저자명: 이도경 이현석
• 간행물 정보: 『한국산업경영시스템학회 학술대회』2008년 추계학술대회 논문집, 1~4쪽, 전체 4쪽
• 주제분류: 공학 > 산업공학
• 파일형태: PDF
• 발행일자: 2008.10.30

영문 초록

Process Capability indices(PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process performance. PCIs have been developed to represent process capability more exactly. In the previous studies, only one designated location on each part is measured. But multiple measurement locations on each part are required to calculate the reliable process capability. In this paper, we propose a new process capability index dealing the multiple measurement locations on each part. Also we showed the relationship between the new index and sigma level according to the number of measurement locations.

목차

1. 서론

2. 본론

3. C(m)지수의 특성분석

4. 결론

키워드

process capability sigma level multiple measurement locations