Optimal M-level Constant Stress Design with a Polynomial Stress Model for Weibull Distribution

• 발행기관: 한국자료분석학회
• 저자명: Gyoung-Ae Moon
• 간행물 정보: 『Journal of The Korean Data Analysis Society (JKDAS)』Vol.6 No.6, 1521~1529쪽, 전체 9쪽
• 주제분류: 자연과학 > 통계학
• 파일형태: PDF
• 발행일자: 2004.12.30

영문 초록

Most of the accelerated life tests deal with tests that use only one accelerating variable and no other explanatory variables. Frequently, however, there is a test to use more than one accelerating or other experimental variables, such as, for examples, a test of capacitors at higher than usual conditions of temperature and voltage, a test of circuit boards at higher than usual conditions of temperature, humidity and voltage. In this paper, a accelerated life test is extended to M-level stress accelerated life test with a polynomial stress model. The optimal design for Weibull distribution is studied with a polynomial stress model.

목차

1. Introduction

2. Optimal M-level constant stress design

3. Numerical Examples

References

키워드

Accelerated life test constant stress polynomial stress model Weibull distribution