가상계측기법을 이용한 불량예측시스템의 경제성 평가

• 영문명: Economic Evaluation of Defect Prediction System Using Virtual Metrology
• 발행기관: 한국산업경영시스템학회
• 저자명: 정성환(Sung Hwan Jung)
• 간행물 정보: 『한국산업경영시스템학회 학술대회』2013년 추계학술대회 논문집, 101~108쪽, 전체 7쪽
• 주제분류: 공학 > 산업공학
• 파일형태: PDF
• 발행일자: 2013.10.23

영문 초록

Virtual metrology(VM) is a promising technology which can convert off-line sampling inspection into on-line total inspection at the manufacturing process. This paper provides an economic evaluation model of VM system which predicts the defects of a target process with Bernoulli sampling inspection. For this purpose, we build M/G/1 queueing models of two systems. One is VM non-applied system and the other is VM applied one. We derive total costs per unit time of each system and conduct sensitivity analysis according to variations of input parameters such as defect rates, various process costs and VM prediction error rates. The proposed analysis model is expected to be used for evaluating economic values of VM system implementation projects.

목차

Abstract

1. 서론

2. 가상계측 시스템 구축 단계

3. 분석 대상 공정

4. 분석 모형

5. 시스템 성능 척도

6. 수치 예제

7. 결론

참고문헌

키워드

Virtual Metrology Economic Evaluation Bernoulli Sampling M/G/1 Queueing Model Sensitivity Analysis