위치모수를 이용한 로버스트 x 관리도의 설계

• 영문명: Design of Robust x Control Chart Using a Location Parameter
• 발행기관: 한국산업경영시스템학회
• 저자명: 정영배(Young-Bae Chung) 김연수(Yon-Soo Kim)
• 간행물 정보: 『산업경영시스템학회지』제37권 제1호, 151~156쪽, 전체 5쪽
• 주제분류: 경제경영 > 경영학
• 파일형태: PDF
• 발행일자: 2014.03.31

영문 초록

Control charts are generally used for process control, but the role of traditional control charts have been limited in case of a contaminated process. Traditional x control charts have not been activated well for such a problem because of trying to control processes as center line and control limits changed by the contaminated value. This paper is to propose robust x control charts which is considering a location parameter in order to respond to contaminated process. In this paper, we consider x a, that is trimmed rate; typically ten percent rate is used. By comparing with p, ARL value, the responding results are decided. The comparison resultant results of proposed two control charts are shown and are well contrasted.

목차

Abstract

1. 서론

2. 기존 연구 고찰

3. 로버스트 x 관리도의 설계

4. 실험 및 분석

5. 결론

References

키워드

Robust Control Chart Contaminated Process Location Parameter