축차 샘플링을 기반으로 한 one-shot devices의 신뢰성 입증 시험

• 영문명: Reliability Demonstration Test for the One-Shot Devices Based on the Sequential Sampling
• 발행기관: 한국산업경영시스템학회
• 저자명: 전종선(Jong seon Jeon) 안선응(Sun eung Ahn)
• 간행물 정보: 『한국산업경영시스템학회 학술대회』2016년 추계학술대회 논문집, 1~5쪽, 전체 5쪽
• 주제분류: 공학 > 산업공학
• 파일형태: PDF
• 발행일자: 2016.10.30

영문 초록

This paper describes the Bayesian approach for reliability demonstration test based on the sequential samples from the one-shot devices. The Bayesian approach involves the technical method about how to combine the prior distribution and the likelihood function to produce the posterior distribution. In this paper, the binomial distribution is adopted as a likelihood function for the one-shot devices. The relationship between the beta-binomial distribution and the Polya’s urn model is explained and is used to make a decision about whether to accept or reject the population of the one-shot devices by one by one then in terms of the faulty goods. A numerical example is also given.

목차

1. 서 론

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3. 결 론

키워드

Bayesian approach sequential sampling beta-binomial distribution one-shot devices reliability demonstration test Polya’s urn model