Demerit-DEWMA 관리도

• 영문명: A Study of Demerit-DEWMA Control Chart
• 발행기관: 한국산업경영시스템학회
• 저자명: 강해운(Hae-Woon Kang) 백재원(Jae-Won Baik) 강창욱(Chang-Wook Kang)
• 간행물 정보: 『산업경영시스템학회지』제33권 제2호, 9~17쪽, 전체 9쪽
• 주제분류: 경제경영 > 경영학
• 파일형태: PDF
• 발행일자: 2010.06.30

영문 초록

Complex products may present more than one type of defects and these defects are not always of equal severity‘ These defects are class ified according to their seriousness and effect on product quality and performance. So, demerit systems are very effective systems to monitor the different types of defects. Recently, Kang et al.(2009) proposed the revised DemeritCUSUM for the evaluation of the Demerit-CUSUM control chart performance exactly. ln this paper, we present an advanced Demerit control chart using the double EWMA technique. The double EWMA technique is very effícient and strong method for process control where defects and nonconformities occur with various defect types. Moreover, we compare ex act performance of Demerit-CUSUM, Demerit-EWMA and Demerit-DEWMA control chart according to changing sample size or mean shifts magnitude. By the result, we confirm that the performance of Demerit-DEWMA control chart is more than the performance of the Demerit-CUSUM and Demerit-EWMA control chart.

목차

1. 서 론

2. Demerit-EWMA 관리도

3. Demerit-DEWMA 관리도의 설계

4. Demerit-DEWMA 관리도의 수행도 평가

5. 결 론

키워드

Demerit Control Chart Statistical Process Control(SPC) Defects