반맹에서 반시야 문양 시유발전위와 빛간섭단층촬영과의 일치성

• 영문명: Correlation of OCT and Hemifield Pattern VEP in Hemianopia
• 발행기관: 대한안과학회
• 저자명: 박성용 박상혁 하승주 박성희,Sung Yong Park, M.D., Sang Hyouk Park, M.D., Seung Joo Ha, M.D., Song Hee Park, M.D.
• 간행물 정보: 『대한안과학회지』Ophthalmological Society,volume49,number11, 1819~1828쪽, 전체 10쪽
• 주제분류: 의약학 > 기타의약학
• 파일형태: PDF
• 발행일자: 2008.11.15

영문 초록

Purpose: To analyze the correlation between RNFL thickness changes measured by OCT and hemifield pattern VEP in hemianopic visual field loss. Methods: Twelve eyes of six patients with hemianopia were studied. Two patients had bitemporal hemianopia caused by chiasmal tumor, one patient had inferior hemianopia caused by traumatic optic neuropathy, and three patients had homonymous hemianopia caused by occipital lobe lesions. The retinal nerve fiber layer thickness around the optic disc was measured by optical coherence tomography (OCT) and visual pattern evoked potentials were measured using hemifield stimulations. Results: Normal eyes of traumatic optic neuropathy patients were excluded from the analysis. The retinal nerve fiber layer thickness as measured by OCT corresponded to the visual field defect in 9 of 11 eyes (81.8%) and the hemifield pattern VEP response corresponded to visual field defect in 7 of 11 eyes (63.6%). Conclusions: RNFL thickness measurement by OCT and hemifield PVEP are useful in evaluation of patients with hemianopia. However, they should be performed with caution, and compared with various clinical examinations because of their incomplete correlation with visual field defects. J Korean Ophthalmol Soc 2008;49(11):1819-1828

키워드

Hemianopia, Hemifield pattern visual evoked potentials, Optical coherence tomography