샘플링검사를 이용한 PLC의 불량률 추정 및 불량원인 개선 사례연구

• 영문명: A Case Study for Estimating the Defect Rate of PLC Using Sampling Inspection and Improving the Cause of Defects
• 발행기관: 한국산업경영시스템학회
• 저자명: 문인선(In-Sun Moon) 이동형(Dong-Hyung Lee)
• 간행물 정보: 『산업경영시스템학회지』제44권 제4호, 128~135쪽, 전체 8쪽
• 주제분류: 공학 > 산업공학
• 파일형태: PDF
• 발행일자: 2021.12.31

영문 초록

WDM(Wavelength Division Multiplexing) is called a wavelength division multiplexing optical transmission method and is a next-generation optical transmission technology. Case company F has recently developed and sold PLC(Planar Lightwave Circuit), a key element necessary for WDM system production. Although Chinese processing companies are being used as a global outsourcing strategy to increase price competitiveness by lowering manufacturing unit prices, the average defect rate of products manufactured by Chinese processing companies is more than 50%, causing many problems. However, Chinese processing companies are trying to avoid responsibility, saying that the cause of the defect is the defective PLC Wafer provided by Company F. Therefore, in this study, the responsibility of the PLC defect is clearly identified through estimating the defect rate of PLC using the sampling inspection method, and the improvement plan for each cause of the PLC defect for PLC yeild improvement is proposed. The result of this research will greatly contribute to eliminating the controversy over providing the cause of defects between global outsourcing companies and the head office. In addition, it is expected to form a partnership with Company F and a Chinese processing company, which will serve as a cornerstone for successful global outsourcing. In the future, it is necessary to increase the reliability of the PLC yield calculation by extracting more precisely the number of defects.

목차

Ⅰ. 서론

Ⅱ. 이론적 배경

Ⅲ. PLC 불량률 추정 및 수율계산

Ⅳ. PLC 부적합 원인별 개선방안

Ⅴ. 결 론

References

키워드

WDM(Wavelength Division Multiplexing) Sampling Inspection PLC(Planar Lightwave Circuit) Defective Wafer Global Outsourcing Strategy