다수 측정 위치를 갖는 단일 공정의 공정능력지수

• 영문명: Process capability index for single process with multiple measurement locations
• 발행기관: 한국산업경영시스템학회
• 저자명: 이도경(Do-Kyung Lee) 이현석(Hyun Seok Lee)
• 간행물 정보: 『산업경영시스템학회지』제30권 제3호, 28~36쪽, 전체 9쪽
• 주제분류: 공학 > 산업공학
• 파일형태: PDF
• 발행일자: 2007.09.30

영문 초록

  Process Capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process performance. PCIs have been developed to represent process capability more exactly. In the previous studies, only one designated location on each part is measured. But even though in single process, multiple measurement locations on each part are required to calculate the reliable process capability. In this paper, we propose a new process capability index with multiple measurement locations on each part. We showed numerical examples and sensitivity analysis according to the number of measurement locations.

목차

1. 서론
2. 선행연구 및 이론적 배경
3. 연구내용
4. 수치예제 및 감도분석
5. 결론
참고문헌

키워드

Multiple Measurement Locations System Process Capability